Using Examiner-Specific Data Analytics to Obtain Better Patents Sooner

Event Details

Using Examiner-Specific Data Analytics to Obtain Better Patents Sooner

Time: May 17, 2012 from 1pm to 2pm
Location: Online
City/Town: Minneapolis
Website or Map: https://www4.gotomeeting.com/…
Phone: Dial-in info will be provided upon registration
Event Type: webinar
Organized By: Christopher Holt
Latest Activity: May 7, 2012

Export to Outlook or iCal (.ics)

Event Description

For the first time in history, patent decision makers now have instant access to dynamically generated statistics indicative of how a specific patent examiner or art unit manages the patent examination process.  This is becoming must-have information because there is significant variation from one patent examiner to the next, and from one art unit to the next, in terms of how prosecution is handled.  For example, while some examiners average 0.6 office actions per allowance, other examiners average more than 6 office actions per allowance.  Knowing which of these examiners you are dealing with is a tremendous advantage.  And that is but one of many categories of now available examiner-specific data analytics.

In this webinar, you'll also receive a demonstration of the PatentCore data system, the first and premiere online source for examiner-specific data analytics. With these tools, you will obtain better patents more efficiently.

Register online at https://www4.gotomeeting.com/register/742534127

Comment Wall

Comment

RSVP for Using Examiner-Specific Data Analytics to Obtain Better Patents Sooner to add comments!

Join Intellectual Property Insiders

Attending (1)

Share

Support


Add your Twitter profile!

Videos

  • Add Videos
  • View All

© 2013   Created by Mikk Putk.

Badges  |  Report an Issue  |  Terms of Service